The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 1988
Filed:
Aug. 12, 1986
Richard M Collins, East Setauket, NY (US);
Richard F Chance, Bayport, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
A composite analyzer probe, for use with a composite analyzer tester instrument for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material. A cylindrical probe housing has a generally flat end surface designed to be placed flat against the surface of the test material. An annular magnetic induction coil is positioned against the end surface, a piezoelectric element having a hollow cylindrical casing is positioned within the annular magnetic induction coil, and an eddy current coil is positioned within the piezoelectric cylindrical casing. The single improved probe allows four different measurements to be taken at one location on the test material without any required movement or replacement of the probe.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile