The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1988
Filed:
Oct. 13, 1983
Tsukasa Yamashita, Nara, JP;
Nobuhisa Inoue, Kyoto, JP;
Kazuhiko Mori, Mishima, JP;
Masaharu Matano, Kyoto, JP;
Isao Taguchi, Nagaokakyo, JP;
Omron Tateisi Electronics Co., Kyoto, JP;
Abstract
A photo-pickup wherein a light emitting portion, a surface acoustic wave generating portion, a lens portion, a light receiving portion and a control portion are integrally integrated on a base plate formed on its surface with a light transmission path. The light emitting portion propagates a light beam to the light transmission path. The light beam propagating in the light transmission path is first deflected within a plane of the light transmission path by surface acoustic wave propagating on the light transmission path and propagated towards the lens portion. The lens portion is provided to project the light beram outside from the light transmission path and effect two-dimentional focusing of the projected beam and adjustment of focal position. The light receiving portion comprises a combination of a plurality of light receiving elements disposed at suitable intervals from the projected position of the light beam to receive a reflected light of the light beam. The control portion is provided to receive an output of the light receiving portion to process a signal and supply said control signal to the surface acoustic wave generating portion and lens portion, thereby effecting the control of deflection angle of the light beam, two-dimentional focusing of the projected beam and control of focal position.