The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 1988

Filed:

Mar. 13, 1985
Applicant:
Inventors:

Franz Auracher, Baierbrunn, DE;

Rudolf Keil, Munich, DE;

Julius Wittmann, Deisenhofen, DE;

Hans-Ludwig Althaus, Lappersdorf, DE;

Gerhard Kuhn, Alteglofsheim, DE;

Assignee:

Siemens Aktiengesellschaft, Berlin and Munich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; H01S / ; G01B / ;
U.S. Cl.
CPC ...
350320 ; 350 9617 ; 350 9620 ; 250227 ; 372 43 ; 372 49 ; 372109 ; 356400 ;
Abstract

A method and apparatus for positioning a laser diode with respect to a coupling optic for a waveguide to obtain the optimum light transmission characterized by providing a reflecting reference plane or surface extending perpendicular to the axis of the waveguide adjacent the coupling optic, projecting light through the waveguide and coupling optic onto the reflecting surface, measuring the amount of light reflected into the waveguide and adjusting the axial position of the waveguide and optic relative to the reflecting surface to obtain the optimum value, then placing the semiconductor with the facet in the reference plane and either operating the semiconductor to provide light for coupling into the waveguide and adjusting the relative positions in a transverse plane to the axis of the waveguide to obtain the optimum transmission or operating the semiconductor laser as a detector and coupling light into the waveguide at a point spaced from the laser to project into the detector and making adjustments in the transverse direction to obtain the optimum reading. The reflecting surface can be either a separate reflecting device or the facet of the laser. The apparatus includes two members each having an abutting surface with one of the members positioning the waveguide with the coupling optic to lie along an axis perpendicular to the abutting surface and the other member positioning the semiconductor laser with the facet lying in the plane of the abutting surface.


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