The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1988
Filed:
Jun. 18, 1986
Applicant:
Inventor:
Shigekazu Minagawa, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
3501622 ; 35016222 ; 35016223 ; 35016224 ;
Abstract
A diffraction grating having a delineated crystallographic diffraction plane which ensuess from a procedure of alternately growing two kinds single crystal layers on a single crystal substrate into multilayers, exposing a crystallographic plane other than the plane of growth in the above-mentioned single crystal layers of the two kinds of single crystal layers in the exposed crystallographic plane; and a process for producing a diffraction grating mentioned above.