The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1988
Filed:
Jun. 16, 1986
Christopher L Vaniglia, West Chester, OH (US);
Perry J Anderson, Cincinnati, OH (US);
Dennis G O'Keefe, Cincinnati, OH (US);
Cincinnati Milacron Inc., Cincinnati, OH (US);
Abstract
A method and apparatus are provided for producing a control signal by digital computation for controlling an element affecting a process. The process is described by a sequence of activities, and the onset of each activity is marked by a predetermined change of a process parameter. An event detector is provided for detecting the occurrence of predetermined changes of process parameters in response to data included within event detector data blocks. The event detector data blocks include data defining the desired response to the detection of a predetermined change of a process parameter. The control signal is produced in accordance with a selected predetermined algorithm using data included in algorithm data blocks. A first event detector data block and a first algorithm data block are selected defining a first predetermined change of a process parameter and a first algorithm. Upon detection of the first predetermined change, of a process parameter, a second predetermined change of a process parameter is selected in accordance with data included within the first selected event detector data block and a second algorithm data block is selected defining a second algorithm.