The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1988
Filed:
Jun. 24, 1986
Applicant:
Inventor:
Masahiko Hatanaka, Otawara, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324312 ;
Abstract
A method and apparatus provides complete mensuration of two-dimensional Fourier components of a nuclear spin property thereby permitting undistorted image reconstruction. In spite of an unavoidable phase factor which originates from basic field inhomogeneities and drifts and from non-perfect electronics adjustment, an optimum sectional image is obtained from half measurements of the sampled resonance signals which are complex conjugate pairs. The image is obtained by determining the phase and then eliminating it from a spatial Fourier transform of the spin density distribution.