The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1988
Filed:
Mar. 17, 1986
Applicant:
Inventor:
Junichi Kitabayashi, Tokyo, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356353 ; 382 43 ;
Abstract
Two light beams capable of interference with each other are applied to an area sensor while they are inclined to each other. The area sensor reads a pattern of interference fringes formed by the two light beams. The read interference fringe pattern is subjected to a Fourier transform, and then an inclination-related component is removed therefrom. Thereafter, an inverse Fourier transform is effected. The shape of the wavefront of light to be measured is determined on the basis of a phase difference between the two light beams which is known from the result of the inverse Fourier transform.