The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1988
Filed:
May. 23, 1986
Applicant:
Inventors:
Yasuo Kato, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Kiwami Horiguchi, Tokyo, JP;
Kiichi Kamiyama, Tokyo, JP;
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Itabashi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ; 351208 ; 351210 ;
Abstract
An improved eye refractive power measuring apparatus is disclosed. The apparatus includes a measurement system for projecting a measurement target image to the retina of an eye to be tested and measuring the refractivity of the eye to be tested by detecting the focussing state of the measuring target image. In addition, it has an eye position detection system for detecting a shifted amount from a proper position of the eye to be tested and an arrangement for correcting a measurement result of the eye refractivity based on such detected result.