The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1988
Filed:
Nov. 07, 1986
Applicant:
Inventors:
Makoto Yoshinaga, Hachiouji, JP;
Yoichi Iba, Hachiouji, JP;
Noriyuki Miyahara, Hachiouji, JP;
Masami Kawasaki, Hachiouji, JP;
Terumasa Morita, Hachiouji, JP;
Takashi Nagano, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
350518 ; 350507 ; 350527 ;
Abstract
A microscope wherein, in order that the observing position may be variable over a wide range of a sample to be observed without requiring a large objective, the objective optical system is so formed as to be movable in parallel with the sample surface and the light path length between the objective optical system and eyepiece optical system is made variable by moving the objective optical system.