The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 1988

Filed:

Dec. 19, 1986
Applicant:
Inventors:

Yutaka Kawata, Kobe, JP;

Takuya Kusaka, Kobe, JP;

Hiroshi Imada, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ; G01S / ; G08B / ;
U.S. Cl.
CPC ...
364561 ; 342124 ; 342130 ; 342174 ; 340612 ;
Abstract

A method an apparatus for measuring the distance to a target wherein FM wave is transmitted to the target and its reflected wave is received. A beat wave is then obtained using the thus-received wave and the FM wave. A sine wave is mixed with the beat wave and a first sideband wave of a plurality of sideband waves of the resultant mixed wave is obtained. Another sine wave is mixed with the sideband wave. Then, a second sideband wave of the thus-obtained mixed wave is separated and detected. In the above manner, phase modulation is applied directly to the above-described beat wave. Information pertaining to distance can then be obtained from the number of peaks of the thus-modulated beat wave. A microwave profile meter suitable for use in the determination of the surface profile of a burden in a blast furnace is also disclosed.


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