The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 1988
Filed:
Dec. 24, 1985
Masaki Sato, Kawasaki, JP;
Kazuyoshi Shinada, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kanagawa, JP;
Abstract
A method for manufacturing a CMOS type semiconductor device is shown which includes the following steps. A first and a second conductive diffusion region are formed in a well region and a semiconductor substrate, respectively, and a gate electrode is formed thereon. An insulation layer is formed on the semiconductor substrate and the well region. A contact hole is opened by selectively removing the insulation layer corresponding to the first and the second conductive diffusion regions. At least one metal layer selected from a group consisting of metal and metal silicide having a high melting point is formed on an exposed surface of the first and the second conductive diffusion regions. The semiconductor substrate is heated to melt at least part of the insulation layer and form a tapered portion. A wiring layer is formed on the contact hole. This method prevents the contact resistance from increasing, the impurity of one region from diffusing into the other impurity regions, the impurity of the impurity regions from decreasing, and improves the reliability of the wiring layer by forming a tapered contact hole. These advantages permit high component density by miniaturizing the device.