The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 1988

Filed:

May. 30, 1986
Applicant:
Inventor:

Kouji Ichino, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
7386118 ; 738665 ; 7386128 ;
Abstract

A gas flow rate measuring device which is capable of removing a probe from a probe socket for inspection and/or replacement at the same time that while gas is flowing through a pipe. The gas flow rate measuring device includes a gas seal mechanism sealedly arranged between the probe socket and a probe coupler. The gas seal mechanism is formed therein with a hollow passage sufficient to allow the probe and a probe support to be moved therein and serves to hermetically seal the probe socket when the probe is removed from the probe socket. The gas flow rate measuring device may also include a ring member fitted on the probe support in a manner to be interposed between the probe support and the probe socket, arranged to prevent the transmission of a roundabout ultrasonic wave.


Find Patent Forward Citations

Quick Actions:

Ichino, Kouji. (1988). Gas flow rate measuring device (U.S. Patent No. 4742717). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4742717

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…