The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 1988
Filed:
Mar. 03, 1987
Alan P Biddle, Euless, TX (US);
Nobie H Stone, Huntsville, AL (US);
David L Reasoner, Huntsville, AL (US);
William L Chisholm, Huntsville, AL (US);
John M Reynolds, Huntsville, AL (US);
Abstract
A vacuum chamber (12) within which an instrument (22) to be calibrated or tested is placed, is fitted with an ion gun (14) having an ion source (48). The source (48) has an electron emitting filament (60) positioned adjacent one end of an ionization chamber (71), with a negatively biased grid (72) located behind the filament (60). Gas is injected into the source (48) by a gas flow regulator (54) in one end (52) of the source (48). The chamber (71) is surrounded by a plurality of independently energizable coils (82, 84, 86, 88, 90), with the last coil (90) being operated at the highest current level, thus producing the highest magnetic flux. This presents a region (160) of magnetic repulsion to the electrons produced by the filament (60) and causes them to be confined between the grid (72) and the region (160), greatly increasing the chances that an ionization collision will occur between the electrons and atoms of injected gas. Ions are extracted from the ionization chamber (71) by a negatively biased extractor grid (106) positioned adjacent an opposite end (80) of the chamber (71) and are collimated by a negatively biased shield grid (110) positioned adjacent the extractor grid (106).