The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1988

Filed:

Sep. 20, 1984
Applicant:
Inventor:

David Beyor, Auburn, NY (US);

Assignee:

Skan-A-Matic Corp., Elbridge, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
250216 ; 250568 ; 235462 ; 235472 ;
Abstract

Optical scanning apparatus of the invention has a scanning range with a large depth of field through the use of a plurality of light sources, which are disposed in a cluster and directed at the bar code to be read thereby increasing the amount of light at the focal plane. This increases the depth of field in which the scanner is effective. A rectangular aperture stop with a length several times the width controls the F/# and allows an increased amount of light to reach the photodetector. A rectangular receiving slit provides an elliptical field of view of the photodetector with the long axis aligned with the bars of the code to be read, so that the scanner is able to 'see' a major portion of the bar or space instead of a small area which may contain printing errors. Thus the intensity of illumination on the object being scanned is maximized, while the depth of the field, and the signal to noise ratio of the receiving system is also maximized so as to enable the resolution of fine, dense, bar codes.


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