The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1988

Filed:

Jan. 24, 1986
Applicant:
Inventor:

John M Reed, Lebanon, NJ (US);

Assignee:

Brandt, Inc., Bensalem, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H / ;
U.S. Cl.
CPC ...
271261 ; 271227 ; 271263 ; 271265 ;
Abstract

Sheet handling and counting apparatus includes a control system having master and slave processors. The slave processor continuously examining passing sheets to measure sheet length and look for doubles. The slave processor generates outputs representative of jam, doubles error, length error and diagnostics as well as detecting the presence of a check separator for stopping the sheet handling and counting apparatus. The master processor controls the sheet apparatus in accordance with the status signals developed by the slave processor, as well as other data derived from sensors interfaced with the master processor. The master processor transmits a control word to the slave processor to control operation of the length measurement according to one of a plurality of selectable tolerances and to select one of a plurality of operating modes for detecting doubles. The slave processor transmits a multibit code word representing the result of the length, doubles and other evaluations for each sheet, the master processor controlling the apparatus in accordance with the evaluation data received from the slave processor. Adaptive techniques are utilized for both length measurement and doubles detection. The length measurement technique permits the accurate counting of sheets, even though they are skewed as they are fed through the apparatus.


Find Patent Forward Citations

Reed, John. (1988). Adaptive doubles and length measurement techniques and apparatus (U.S. Patent No. 4741526). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4741526

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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