The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 1988

Filed:

Jun. 26, 1985
Applicant:
Inventors:

Yoshitsugu Sakata, Ootsu, JP;

Haruki Oishi, Ikeda, JP;

Yasumichi Hatayama, Osaka, JP;

Hiromi Shiraishi, Toyonaka, JP;

Kazuya Yanagisawa, Itami, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
435 18 ; 73 641 ; 422 73 ; 436502 ; 436517 ; 436805 ;
Abstract

Endotoxin contents in samples can be determined qualitatively, or quantitatively, singly or in parallel, with high precision in a short time by a process comprising applying a light to each sample solution, measuring an initial transmitted light amount I.sub.0 and a transmitted light amount at a time t, I(t), to give a ratio R(t)=I(t)/I.sub.0, and judging a gelation point by a threshold value of R(t), or further obtaining a gelation time from the gelation point. An apparatus used therefor is also disclosed.


Find Patent Forward Citations

Sakata, Yoshitsugu. (1988). Process for measuring endotoxin and apparatus used therefor (U.S. Patent No. 4740460). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4740460

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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