The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1988
Filed:
Mar. 31, 1986
Etsuji Yamamoto, Akishima, JP;
Kensuke Sekihara, Mountain View, CA (US);
Hidemi Shiono, Akigawa, JP;
Hideki Kohno, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method for providing spin density distribution images of an object, discriminated with respect to plural chemical shifts. This method is performed by repeating a measurement sequence in a spin warp imaging method, of the spin data plural times, with a time difference .DELTA..tau. between a time interval .tau..sub.1 from spin excitation to a 180.degree. RF pulse and a time interval .tau..sub.2 from the 180.degree. RF pulse to a peak of a spin echo, altering .DELTA..tau. in the ways corresponding the number of chemical shifts to be discriminated from one another, subjecting the respective spin data to two-dimensional Fourier transform to provide plural sets of spin data for respective coordinates in a spatial domain, and solving simultaneous equations of the sets of spin data to provide spin densities corresponding to the respective chemical shifts.