The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 1988

Filed:

Jul. 08, 1986
Applicant:
Inventor:

Horst Burkhardt, Truchlaching, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A45B / ; H01J / ;
U.S. Cl.
CPC ...
2502 / ; 3312 / ; 356375 ;
Abstract

A position measuring arrangement for the measurement of the relative position of two objects shiftable with respect to one another wherein the measuring graduation is connected with the first object and is scanned by a scanning unit fastened to the second object. Four binary scanning signals are produced by the scanning unit with a predefined relative phase relationship. The signals are applied to a logic network for the generation of a linked binary signal. In the case of no errors, the linked binary signal is equal to a selected one of the four binary signals. In the event of an error, the linked binary signal is not equal to the selected one of the binary signals. The linked binary signal and the selected binary signal are applied to a comparator for a determination of equality and thereby a determination of the presence of errors.


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