The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 1988

Filed:

Oct. 30, 1985
Applicant:
Inventors:

Pierre Blanchard, Echirolles, FR;

Jean P Cortot, Grenoble, FR;

Assignee:

Thomson-CSF, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ; H01L / ;
U.S. Cl.
CPC ...
437 53 ; 29571 ; 29578 ; 29591 ; 148D / ; 148D / ; 148D / ; 437193 ; 437241 ;
Abstract

In order to fabricate gates for an integrated circuit formed on a semiconductor substrate of silicon covered with at least one layer of oxide, one layer of polycrystalline silicon and if necessary one layer of silicide, an initial step consists in successive deposition of a silicon nitride layer and a silicon oxide layer, openings in these two layers being then formed by photoetching in a second step. In a third step, the silicon oxide layer is partly removed by deoxidation in order to bare the nitride layer over a certain distance which determines the spacing between two consecutive gates, oxide being then grown within the openings formed during the second step. The final step consists in removing the nitride regions uncovered during the third step as well as the subjacent silicide layer if this latter is provided and the subjacent polycrystalline silicon layer.


Find Patent Forward Citations

Loading…