The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1988
Filed:
May. 25, 1984
Dean Morgan, Austin, TX (US);
Other;
Abstract
Apparatus for the simultaneous and uniform sampling of grain and recording of temperature from various predetermined locations within a grain storage facility. The apparatus consists of a drive section made of high strength material, such as steel, to which is attached a downwardly spiraling flight which enables the device to be driven into or out of stored grain. Attached above the drive section are sampling sections of equal length made of a light strong material, such as aluminum. Each of the sample sections has a sampling gate, which when opened receives samples of grain from each of the predetermined locations within the grain storage facility. Additionally, the device incorporates a thermometer within each of these sampling sections which is attached and secured in position by an alignment bar which additionally serves to positively join each of the sections to the other. Below the drive section is attached a shorter sampling section which comprises the tip of the probe. This tip section also has a sample gate and a thermometer, thereby providing the ability to obtain a sample and a temperature reading from very close to the floor of the storage unit. Further, the sampling tip section has a rounded point to help prevent damage to the floor of the storage unit. Sample gates are opened by first removing the drive adapter from the top sampling section, thereby exposing the top of an alignment bar which is square in shape. The gate-actuating tool is placed over the top of the alignment bar and, when rotated a quarter turn in either direction, simultaneously opens the gates in all sections of the probe. After the sample is obtained, returning the gate-actuating tool to its original position closes the gates. As the probe is withdrawn from the grain storage facility a detent release tool is used to depress the detents on the alignment bars and thereby separate each of the sections.