The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1988
Filed:
Sep. 30, 1986
Applicant:
Inventors:
Tsunehiko Araki, Takarazuka, JP;
Satoshi Furukawa, Osaka, JP;
Tadashi Satake, Hirakata, JP;
Hidekazu Himezawa, Shijonawate, JP;
Assignee:
Matsushita Electric Works, Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358108 ; 358105 ; 358-1 ;
Abstract
An abnormality supervising system compares an input picture with a previously stored reference picture having no abnormality, provides a compared picture signal to an abnormality discrimination means having preliminarily stored information for abnormality discrimination, and, upon presence of an abnormality, operates an output means for informing operation, whereby the abnormality discrimination means can effectively attain the abnormality discrimination on the basis of the preliminarily stored information, in a highly reliable manner.