The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1988
Filed:
Feb. 27, 1986
Applicant:
Inventor:
Akihiko Taniguchi, Nara, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
355 / ; 355 68 ;
Abstract
An abnormal condition detection device for an automatically controlled light scanning device includes a light exposure lamp for emitting light toward an original mounted on an original table, a reflection plate for reflecting light from at least a portion of the original table, a sensor for receiving light reflected from the reflection plate, a plurality of comparators for detecting the amount of light received by the sensor, and a detection circuit for determining whether or not the amount of light detected by the comparators is within a predetermined normal range.