The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1988
Filed:
Jan. 13, 1987
Yoshio Shishido, Sagamihara, JP;
Susumu Takahashi, Hachioji, JP;
Matsuo, Kazumasa, Tama, JP;
Miyazaki, Atsushi, Hachioji, JP;
Shinichi Nishigaki, Hachioji, JP;
Shinichi Kato, Hachioji, JP;
Takeaki Nakamura, Hino, JP;
Akibumi Ishikawa, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An apparatus for detecting a focused condition of an optical system, in which a light-receiving means arranged at a fixed position corresponding to a focus position photometrically detects a focused condition. A light beam having a definite shape is projected onto an object to be imaged by a light projection means. The reflected light beam is conducted along an optical axis of the optical system, deflected, and detected by the light receiving means for determining whether a focused condition exists. Several embodiments are disclosed for projecting a light spot of high contrast on the object and for detecting a focused condition on the basis of the intensity distribution of light received by the light-receiving means. The apparatus may be applied to an endoscope and other optical systems.