The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 1988

Filed:

Dec. 06, 1985
Applicant:
Inventors:

Thomas Gonsiorowski, Arlington, MA (US);

Julius Feinleib, Cambridge, MA (US);

Peter F Cone, Bedford, MA (US);

Andrew J Jankevics, Watertown, MA (US);

Kelsey S Nikerson, Arlington, MA (US);

Lawrence E Schmutz, Watertown, MA (US);

Anthony Vidmar, Watertown, MA (US);

Allan Wirth, Bedford, MA (US);

Assignee:

Adaptive Optics Assoc., Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250201 ; 350360 ;
Abstract

A wavefront sensing and compensating system for detecting and correcting for distortion in light wavefronts is described in which the wavefront is divided into a plurality of subapertures and light intensified and imaged as spots of light from each subaperture onto a detector array. The individual detector elements of the array form a plurality of electrical signals proportional to the local divergence of the vector gradient field (.gradient..sup.2 .phi.). This .gradient..sup.2 .phi. signal after interfacing or reconstruction is applied to corrective mirrors which may be of the deformable or membrane type.


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