The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1988
Filed:
Feb. 20, 1981
Donald R Webster, Laurel, MD (US);
Pacific Scientific Company, Anaheim, CA (US);
Abstract
An optical analysis system employs a rectangular beam of light passing through interference filters to analyze the constituents of a test sample moving through the beam. A plurality of interference filters are moved successively through the beam between the source of the beam and the sample and are tilted about an axis as they are moved, thereby transmitting a range of wavelengths to the sample. Skew rays of light in the beam strike the filters at different angles from the angles at which rays parallel to the axis of the beam strike the filters and so transmit wavelengths different from those of rays parallel to the axis of the beam. The angle deviation is greatest for the skew light rays which are skewed from the axis of the beam in a plane perpendicular to the tilt axis of the filters. Thus, the shorter dimension of the rectangular beam is arranged to be perpendicular to the tilt axis of the filters.