The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 1988

Filed:

Apr. 21, 1987
Applicant:
Inventors:

Jack Sacks, Thousand Oaks, CA (US);

Valerie A Liudzius, Chatsworth, CA (US);

Gary DeZotell, Canoga Park, CA (US);

Richard E DeKlotz, Moorpark, CA (US);

Assignee:

View Engineering, Inc., Simi Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 34 ; 382 30 ; 382 44 ; 382 48 ;
Abstract

An apparatus and method for storing a reference scene and a scene under search in separate addressable memories. The reference scene is addressed along a scan line at a selected angle giving the impression that the reference memory has been rotated. The search area information is convolved with a stored reference information to obtain a count representing the number of matches for each search position at a plurality of selected angles. The convolved count is accumulated and the search stopped when the accumulated count exceeds a given threshold value. The X Y coordinates of the best search is determined by evaluating the highest accumulation count. The angle orientation of the search area is determined by addressing each scan line readout of the stored reference area at small angles, convolving the readout against the memory readout, accumulating the count for a selected number of scan angles and determining the angle position having the highest count as a measure of the alignment angle of the search area.


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