The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1988
Filed:
Mar. 22, 1985
Shimadzu Corporation, Kyoto, JP;
Abstract
An apparatus for measuring the size distribution of particles by making use of centrifugal force field, comprising a mechanism for making a suspension revolve, an optical unit for detecting a light absorption by the suspension, and a micro-computer. The suspension suspends test particles whose size distribution is to be measured. The optical unit measures a time-dependent particle concentration variation due to the particle movements forced in a centrifugal force field produced by the revolution of the suspension. The micro-computer is provided with a memory for storing equations to obtain the size distribution of particles from the measured particle concentration variation and equations for correcting adverse effects by non-parallel particle movements in a centrifugal force field, to give a particle size distribution free from the error arising from the non-parallel movements of particles.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile