The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1988
Filed:
May. 28, 1986
Applicant:
Inventors:
Koichi Sano, Yokohama, JP;
Shimbu Yamagata, Yokohama, JP;
Koichi Haruna, Yokohama, JP;
Hideaki Koizumi, Katsuta, JP;
Shinichi Sato, Yokohama, JP;
Tetsuo Yokoyama, Tokyo, JP;
Ryuzaburo Takeda, Mito, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324312 ; 324307 ;
Abstract
In order to make an accurate display possible even in case image data having been subjected to a Fourier transformation have negative values, the sampling timing deviations of measured signals having phase errors based on various factors are detected from the gradient of the linear components of the image data having been subjected to the Fourier transformation, and the density values of the image having the detected timing deviations corrected are displayed.