The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1988
Filed:
Oct. 24, 1985
Takao Okada, Kawasaki, JP;
Hiromu Uda, Momoyama, JP;
Hiromu Maeda, Hamamatsu, JP;
Eiichi Suzuki, Hamamatsu, JP;
501 Ikegami Tsushinki Co., Ltd., Tokyo, JP;
Abstract
An outer appearance quality inspection system comprising a mechanism for aligning objects to be inspected, a mechanism for transporting the aligned objects, light projectors for illuminating a light within a predetermined wavelength range against the objects being transported, light receiving devices for receiving the light reflected from each of the objects so as to convert the light into an electrical signal, an electronic circuit for obtaining the data representative of the conditions of the surfaces of the object in response to the electrical signal derived from the light receiving devices, and a mechanism for sorting the objects being transported in response to the data derived from the electronic circuit. The system can inspect the size, visible surface damages and coloring of an object such as orange automatically and reliably.