The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 1988
Filed:
Sep. 16, 1986
Rajendra K Shenoy, Commack, NY (US);
Robert B Wolf, Medford, NY (US);
Terry Morrone, Greenlawn, NY (US);
Raymond V Damadian, Woodbury, NY (US);
Fonar Corporation, Melville, NY (US);
Abstract
A method for obtaining in the course of a single scan T1-weighted and T2-weighted NMR imaging data for a plurality of selected planes in an object using nuclear magnetic resonance techniques. The method is accomplished by positioning an object to be imaged in a static homogeneous magnetic field and then carrying out a plurality of repetitions of a repetition sequence composed of NMR excitation and magnetic field gradient pulses for a plurality of selected planes in the object. The repetition sequences for each of the selected planes include a combination of a T1-weighted pulse sequence having a TE.sub.1 and TR.sub.1 suitable for obtaining T1-weighted NMR imaging data and a T2-weighted pulse sequence having a TE.sub.2 and TR.sub.2 suitable for obtaining T2-weighted NMR imaging data. The repetition sequence for each selected plane is repeated a plurality of times and carried out in a manner so as to encode spatial information into the collection of NMR signals. Also, the T1-weighted and T2-weighted pulse sequences for each selected plane is carried out during the recovery time intervals provided in the repetition sequence for other selected planes. In this manner, T1 and T2-weighted NMR image data for a plurality of planes are obtained in a single scan in significantly reduced time.