The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 1988

Filed:

Jul. 28, 1987
Applicant:
Inventor:

Nicholas C Szuchy, Babylon, NY (US);

Assignee:

Grumman Aerospace Corporation, Bethpage, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250227 ; 356 32 ; 73800 ;
Abstract

A fiber optic load measuring system, and method of constructing the same, are disclosed which comprises a light source, a fiber optic attenuator, a photodetector, and a signal processor. The fiber optic attenuator was formed to have a curved portion along the length thereof disposed in low transfer relation with the surface where the load is to be measured. The signal processor is adapted to receive signals from the photodetector and measure variations attributable to the application of a load on the surface. The processor is further adapted to linearly translate the detected variations to compute deformation of the curved portion in response to an applied load.


Find Patent Forward Citations

Szuchy, Nicholas. (1988). Continuous strain measurement along a span (U.S. Patent No. 4734577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4734577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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