The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 1988
Filed:
Oct. 15, 1986
Applicant:
Inventors:
Masayuki Tanaka, Kawasaki, JP;
Shinichi Ohe, Yokohama, JP;
Naoki Yuguchi, Yokohama, JP;
Akira Tago, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356336 ; 356339 ; 356343 ; 356400 ;
Abstract
A particle analyzing apparatus is provided with an irradiating optical system for applying a light beam to a particle to be examined flowing through a circulation portion in a flow cell, a photometering optical system for photometering the light from the particle to be examined irradiated by the irradiating optical system, and moving means for rendering a base bed on which the flow cell and the photometering optical system are placed movable relative to the irradiating optical system.