The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 1988
Filed:
Jul. 25, 1986
Applicant:
Inventor:
Nicolas J Harrick, Ossining, NY (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356300 ; 356244 ;
Abstract
A novel internal reflection element and associated optics for examining micro- or nano-gram quantities of a sample material by internal reflection spectroscopy, wherein the element is sized for ease of handling, and is configured to allow entrance of a radiation beam at one end, to guide the radiation to the opposite end, to concentrate the guided radiation at a small triangular-shaped sampling surface, from which the beam is directed out of the element. Adjustable masking means is also provided to reduce the unmodulated content or undesired portions of the exiting beam.