The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 1988
Filed:
Sep. 20, 1985
Marvin J Holter, Ann Arbor, MI (US);
David Zuk, Ann Arbor, MI (US);
Vernon Larrowe, Ypsilanti, MI (US);
Robert J Maxwell, Ann Arbor, MI (US);
Environmental Research Institute of Michigan, Ann Arbor, MI (US);
Abstract
A pattern recognition system for use with a two-dimensional image, each point associated with a height and with contributions from various wavelengths of light. The image to be analyzed is first sensed by a sensor and stored in a memory. Signals, read from the memory, are filtered and processed to produce signals measuring each of the wavelengths and measuring the height. The resulting distributions of data are first scanned for areas containing appropriate height measurements. Each pixel of these areas is classified according to predetermined classification definitions, further reducing the areas to be processed. These areas are subjected to spatial classification according to other classification definitions. The spatial classification may be accomplished by a neighborhood processor. The areas of the image are then identified with the features to be recognized.