The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 1988

Filed:

Sep. 29, 1986
Applicant:
Inventors:

Andre Plessis, Clamart, FR;

Emile Gabbay, Paris, FR;

Jacques Trotel, Palaiseau, FR;

Assignee:

Thomson-CGR, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K / ; G21K / ;
U.S. Cl.
CPC ...
378156 ; 378147 ; 378146 ; 378157 ;
Abstract

The present invention concerns an X-ray examination apparatus allowing to produce images of an object through the scanning of the object by at least two fan-shaped beams having different energy spectra, and obtained from a single X-ray source, thereby allowing to obtain simultaneously images of the object adapted to contain different informations.


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