The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 1988

Filed:

Oct. 15, 1985
Applicant:
Inventors:

Kazumasa Saito, Kawasaki, JP;

Hiroyuki Maezawa, Sagamihara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 19 ; 364200 ; 364300 ;
Abstract

A diagrammatic method is disclosed of testing a program in a data processing system equipped with a display terminal for interactive operations. Program specification inputs are given in a diagrammatic form through interactive operations and are edited into diagrammatic specifications. Those diagrammatic specifications are then translated into a source program described in, for example, FORTRAN, in which are interspersed comment statements each of which indicates a diagrammatic specification corresponding to the associated statement of the source program. In the course of a test the diagrammatic specification corresponding to a process under execution is retrieved and displayed according to a comment statement, and the portions corresponding to executed operations are displayed distinctively, for example, in a special color, while the resultant values of variables are also displayed.


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