The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1988
Filed:
Jun. 06, 1986
Applicant:
Inventors:
Ichiro Kasai, Santa Barbara, CA (US);
Roderic L Osgood, Goleta, CA (US);
Charley B Burgett, Santa Barbara, CA (US);
Richard J Joyce, Thousand Oaks, CA (US);
Michael D Warfield, Oxnard, CA (US);
Assignee:
Santa Barbara Research Center, Goleta, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 3241 / ;
Abstract
Method and apparatus for testing photodiode arrays using an electron beam. The diodes are charged at successive intervals over the RC time constant curve to develop successively increasing voltages at the ends of succeeding time intervals. Diode voltage and current are measured at the end of each interval and the resulting data are used to develop a current-voltage characteristic for each diode.