The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1988

Filed:

Sep. 16, 1985
Applicant:
Inventor:

Barry F Belanger, Milwaukee, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 99 ; 378-7 ; 378145 ; 378147 ;
Abstract

A scatter radiation compensation method for use in a medical diagnosis x-ray imaging system employs the use of an attenuating material placed in an x-ray beam to attenuate a portion of the beam such that the in-line component of the beam is reduced in the attenuated area. In one embodiment, an additional image is then taken utilizing an attenuator through out the full area of the beam to provide an image indicative of in-line components of the x-ray beam. The difference in image intensity between the two images is then computed to determine the scatter component of intensity and that intensity is thereafter substracted from the overall intensity obtained in a medical diagnostic image to obtain an image with the scattering effects removed. In one embodiment, the attenuating objects are plural spaced objects located at predetermined positions in the image. In a further embodiment, the image is taken through an attenuating object covering the entire beam, the object having a plurality of holes located at spaced intervals for permitting a portion of the beam to pass through unattenuated. In either embodiment, the component of scattering is determined by comparing the relative intensity values between the images developed with an object passing a portion of the beam unattenuated and an object passing an attenuated beam.


Find Patent Forward Citations

Loading…