The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1988

Filed:

Apr. 07, 1986
Applicant:
Inventors:

Hiroshi Fukuyama, Tokyo, JP;

Yasuo Suzuki, Tokyo, JP;

Shigeru Yoshida, Tokyo, JP;

Hirohide Taguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01G / ; G01L / ;
U.S. Cl.
CPC ...
177211 ; 177134 ; 7386266 ;
Abstract

A measuring equipment comprising a single plate-like structure of which the central and peripheral portions are linked by beams at a minimum of 4 places. The central portion of the single plate-like structure is a board to which a load is to be applied, and pairs of strain gauges, each provided with 2 resistors, are attached on the top and bottom faces or the side faces, respectively, of each beam. A load applied to the loading board is detected as strain by the strain gauges at each beam which provide electrical outputs for indicating load.


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