The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1988
Filed:
May. 09, 1985
Morris Taylor, Austin, TX (US);
Ira L Morgan, Austin, TX (US);
Hunter D Ellinger, Austin, TX (US);
Forrest F Hopkins, Austin, TX (US);
Thomas Stephens, Leander, TX (US);
Scientific Measurement Systems I, Ltd., Austin, TX (US);
Abstract
An apparatus and method of non-contacting, non-destructive, on-line dimensional analysis and flaw detection of tubular products are disclosed. The apparatus includes penetrating radiation sources and detectors arranged about the product to be examined and a high-speed data processing system which employs novel computed tomography techniques to provide high precision dimensional estimates and flaw detection. The apparatus is capable of continuously determining the outside diameter, inside diameter, wall thickness, ovality, eccentricity, and weight-per-foot over a wide range of temperatures for essentially tubular products produced on a unit or continuous basis. The apparatus can also detect process-induced flaws in the products.