The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1988
Filed:
May. 30, 1985
Isao Endo, Kokubunji, JP;
Teruyuki Nagamune, Kamifukuoka, JP;
Ichiro Inoue, Tokyo, JP;
Kozo Inoue, Ichikawa, JP;
Tadashi Nohira, Shiroi, JP;
Ikuzo Kagami, Tokyo, JP;
Tatsuya Iwakura, Yokohama, JP;
Komatsugawa Chemical Engineering Co., Ltd., Tokyo, JP;
Rikagaku Kenkyusho, Wako, JP;
Fuji Facom Corporation, Hino, JP;
Abstract
In a turbidimeter for measuring a turbidity of a test solution to be measured i.e. culture solution in a fermentation apparatus, a semiconductor laser diode and a semiconductor photodiode are integrally arranged in a detection portion of the turbidimeter in such a manner that a laser beam emitted from the semiconductor laser diode is made incident upon the semiconductor photodiode through the test solution. Moreover, a protection circuit for the semiconductor laser diode and the semiconductor photodiode is also arranged in the turbidimeter to cut off a current flowed therethrough when an environmental temperature becomes above a predetermined temperature. Therefore, the turbidimeter can be made small in size and light in weight, and the turbidity can be measured accurately over wide range.