The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1988
Filed:
Feb. 25, 1986
Applicant:
Inventors:
Burke E Nelson, Albuquerque, NM (US);
Marion L Scott, Albuquerque, NM (US);
Assignee:
R & D Associates, Marina Del Rey, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356360 ; 350607 ;
Abstract
A system is described for testing aspheric optic elements by the interference of light beam components that are respectively directed to the element to be tested and to a reference element, which facilitates the testing. A reference element is deformable in a controlled manner to more closely match the element to be tested, to produce straighter and more even fringes.