The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1988

Filed:

May. 22, 1985
Applicant:
Inventors:

Allan Wirth, Bedford, MA (US);

Julius Feinleib, Cambridge, MA (US);

Lawrence E Schmutz, Watertown, MA (US);

Douglas H Rapkine, Somerville, MA (US);

Robert F Dillon, Belmont, MA (US);

John J Hizny, North Billerica, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356121 ; 250201 ; 2502 / ;
Abstract

A wavefront sensor for detecting distortion in light wavefronts is described in which the wavefront is divided into a plurality of subapertures and light amplified or intensified and imaged as spots of light from each subaperture onto a filter mask. The filter mask encodes a predetermined function of the spot intensity distributor onto the light intensity of the spot transmitted through the filter. For spot centroid calculation, the function is linearly variable. Mask embodiments include linearly varying alternate opaque and transparent chevrons, electronically variable chevrons, and quadratically varying chevrons.


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