The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 1988

Filed:

Jun. 26, 1986
Applicant:
Inventors:

Hirohide Miwa, Kawasaki, JP;

Keiichi Murakami, Kawasaki, JP;

Akira Shiba, Kawasaki, JP;

Takaki Shimura, Machida, JP;

Hajime Hayashi, Yamato, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128660 ; 73602 ;
Abstract

An apparatus for measuring acoustic characteristic values of a medium by sending ultrasound pulses into the medium and analyzing the reflected waves from the medium. Medium characteristic values are extracted from the reflected waves, and spectrum scalloping is eliminated. The present invention executes the nonlinear filtering process, for example, the median filtering process to the spectrums, applies a model spectrum to the filtered result and thereby facilitates measurement of supressing fluctuation even when a small number of space average samples one used, by obtaining .beta. from such model spectrum.


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