The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1988

Filed:

Apr. 14, 1986
Applicant:
Inventor:

Wolfgang Koch, Heroldsberg, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H04B / ;
U.S. Cl.
CPC ...
455 67 ; 455226 ; 455303 ; 455 52 ; 324 / ;
Abstract

Method and apparatus for measuring the quality of the radio transmission channels during the transmission in progress, and for recording co-channel interferences, fast fluctuations caused by interferences are separated from slow fluctuations caused by fading, are measured and a quality indicator is derived from the test values of fast and slow fluctuations. By means of the separate measurement of the sum of the power of the receiver input noise and the power of co-channel noise sources it is possible to effect in a simple way and manner a selection of the stationary station having the best receiving condition.


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Koch, Wolfgang. (1988). Method of and circuit arrangement for measuring the quality of (U.S. Patent No. 4723303). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4723303

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