The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1988

Filed:

Sep. 03, 1986
Applicant:
Inventors:

Aminadav Livnat, Arad, IL;

Oded Kafri, Beer-Sheva, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356374 ;
Abstract

A Moire system for linear measurement of an unknown distance defined by two surfaces, a collimated light source, a first grating between light source and the surfaces, a second grating positioned to receive collimated light from the surfaces after the light has reached the surfaces from the first grating, the first and second gratings being rotated relative to each other by a small angle .theta., a screen located after the second grating for receiving Moire patterns caused by the first and second gratings, and a mechanism for shifting the patterns as a function of the unknown distance whereby measurements of the amount of shifting is determinative of the unknown distance.


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