The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 1988

Filed:

Jun. 23, 1986
Applicant:
Inventor:

Francis A L'Esperance, Englewood, NJ (US);

Assignee:

LRI L.P., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351212 ; 1283031 ;
Abstract

The invention contemplates instrumentation to aid in performing refraction-corrective surgery on the cornea, (1) by determining the topography of the anterior surface of the cornea, the determination being in the form of digitized data entered into computer storage, (2) by determining the local thickness of the cornea along multiple axes, the determination being also in the form of digitized data entered into computer storage, and (3) by providing a CAD/CAM display of both categories of data, correlated as appropriate for the surgeon's selective display of a corneal region, aspect or section, as the surgeon may deem pertinent to a prospective operation.


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L'Esperance, Francis. (1988). Apparatus for analysis and correction of abnormal refractive errors of (U.S. Patent No. 4721379). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4721379

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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