The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 1988

Filed:

Feb. 18, 1986
Applicant:
Inventor:

Aspi B Wadia, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-2 ; 356 71 ; 382 22 ; 382 25 ;
Abstract

Improved method and apparatus are provided for hand dimension verification. A two dimensional scanner provides image data from top and angled scans to an image processor which processes this data to develop invariable hand measurements using reference points located from contour sequences generated from the image scan data. The reference points are located so as to be immune from variations introduced by fingernail length, hand pressure and finger spread. Finger width measurements are made using certain reference points and finger width variations are used to determine the presence of abnormalities which could be natural or introduced by wearing of jewelry. The finger width variations are in effect removed by locating finger contour points at the beginning and ending of the variations and using finger slope data for trimming and thereby provide invariable finger width measurements together with finger thickness, finger length and hand area measurements for hand dimension verification.


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