The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1988

Filed:

Aug. 11, 1986
Applicant:
Inventor:

Haruhiro Hyodo, Toyohashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
355 52 ; 355-8 ; 355 57 ;
Abstract

The present invention relates to a scan type anamorphic magnifying apparatus capable of a so-called anamorphic magnification for appropriately enlarging or reducing an image of an original document scanned by a slit exposure method through varying a vertical-lateral proportion of the image, and more particularly to the scan type anamorphic magnifying apparatus comprising a first anamorphic optical element including a cylindrical lens and the like having a negative refracting power in a scanning direction and a second anamorphic optical element including a cylindrical lens and the like having a positive refracting power in the scanning direction both of which are provided to be cooperative with each other in a projection optical path extending toward a photosensitive member.


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