The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1988
Filed:
Dec. 23, 1985
Hans-Peter Kugler, D-7519 Zaisenhausen, DE;
Norbert Eisenreich, D-7507 Pfinztal 1, DE;
Adam Geissler, D-7529 Karlsdorf-Neuthard, DE;
Klaus Fabry, D-7519 Walzbachtal, DE;
Other;
Abstract
A method for investigating a volume change of a sample under tension, with a sample being scanned by a first light beam and the light beam reflected from the sample being detected and further processed. The sample is then illuminated with at least one additional light beam of finite width, with the light beam being converted into a first voltage behind the sample, and a transverse pattern of different reflectivity is scanned by the first light beam longitudinally, and with the change in frequency, produced by stretching, in the reflected light intensity-modulated in this fashion being converted into a corresponding second voltage and the voltages are compared with one another, possibly after calibration.